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扫描探针单电子电容谱
JoVE Journal
Engineering
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JoVE Journal
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Scanning-probe Single-electron Capacitance Spectroscopy
Please note that all translations are automatically generated.
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扫描探针单电子电容谱
DOI:
10.3791/50676-v
•
10:53 min
•
July 30, 2013
•
Kathleen A. Walsh
,
Megan E. Romanowich
,
Morewell Gasseller
2
,
Irma Kuljanishvili
3
,
Raymond Ashoori
,
Stuart Tessmer
1
Department of Physics and Astronomy
,
Michigan State University
,
2
Department of Chemistry & Biochemistry/Physics
,
Mercyhurst University
,
3
Department of Physics
,
Saint Louis University
,
4
Department of Physics
,
Massachusetts Institute of Technology
Chapters
00:05
Title
01:57
Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit
06:37
Capacitance Mode Measurements
08:05
Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors
10:17
Conclusion
Summary
Automatic Translation
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Automatic Translation
扫描探针单电子电容谱有利于在本地化的地下区域的单电子运动的研究。一个敏感的低温扫描探针显微镜研究半导体样品的表面下方的小系统的掺杂原子电荷检测电路纳入。
Tags
Scanning-probe
Single-electron
Capacitance Spectroscopy
Electronic Quantum Structure
Subsurface Charge Accumulation (SCA) Imaging
Spatial Resolution
Charge Resolution
HEMT
Cryogenic Temperatures
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