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扫描探针单电子电容谱
JoVE Journal
Engineering
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JoVE Journal Engineering
Scanning-probe Single-electron Capacitance Spectroscopy
DOI:

10:53 min

July 30, 2013

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Chapters

  • 00:05Title
  • 01:57Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit
  • 06:37Capacitance Mode Measurements
  • 08:05Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors
  • 10:17Conclusion

Summary

Automatic Translation

扫描探针单电子电容谱有利于在本地化的地下区域的单电子运动的研究。一个敏感的低温扫描探针显微镜研究半导体样品的表面下方的小系统的掺杂原子电荷检测电路纳入。

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