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Chapters
- 00:05Title
- 01:57Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit
- 06:37Capacitance Mode Measurements
- 08:05Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors
- 10:17Conclusion
Scanning-sonde enkelt elektron kapacitans spektroskopi letter undersøgelsen af single-elektron bevægelse i lokaliserede underjordiske regioner. En følsom charge-afsløring kredsløb er inkorporeret i en kryogen scanning probe mikroskop at undersøge små systemer doteringsstofatomer under overfladen af halvleder prøver.
