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JoVE Journal Engineering
All-elektronische Nanosecond-resolved Scanning Tunneling microscopie
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All-elektronische Nanosecond-resolved Scanning Tunneling microscopie: Vergemakkelijken van het onderzoek van één dopering gratis Dynamics

Article DOI: 10.3791/56861-v • 11:33 min • January 19th, 2018
January 19th, 2018 •
1,2, 1, 3,4,5, 1,2,6, 1, 2, 3,4, 1,2
1Department of Physics, University of Alberta, 2National Institute for Nanotechnology, National Research Council of Canada, Edmonton, 3Max Planck Institute for the Structure and Dynamics of Matter, 4Max Planck Institute for Solid State Research, 5Department of Physics and Astronomy, University of Manitoba, 6Joint Attosecond Science Laboratory, University of Ottawa

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We tonen een all-elektronische methode om te observeren nanosecond-resolved gratis dynamiek van dopering atomen in silicium met een scanning tunneling microscoop.

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Engineering kwestie 131 All-elektronische time-resolved scanning tunneling microscopie time-resolved scanning tunneling spectroscopie dopering dynamiek silicium bungelende obligaties all-elektronische pomp-sonde spectroscopie enkel atoom gratis dynamics
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