Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / I Dybde Analyser af lysdioder ved en kombination…
JoVE Journal
Engineering

A subscription to JoVE is required to view this content.

JoVE Journal Engineering
I Dybde Analyser af lysdioder ved en kombination af X-ray Computed Tomography (CT) og Light Microscopy (LM) korreleret med Scanning Electron Microscopy (SEM)
The Immersive Cleveland Clinic Virtual Reality Shopping Platform for the Assessment of Instrumental Activities of Daily Living
Journal (Engineering)
The Immersive Cleveland Clinic Virtual Reality Shopping Platform for the Assessment of Instrumental Activities of Daily Living
Automated Delivery of Microfabricated Targets for Intense Laser Irradiation Experiments
Journal (Engineering)
Automated Delivery of Microfabricated Targets for Intense Laser Irradiation Experiments
 
Click here for the English version

I Dybde Analyser af lysdioder ved en kombination af X-ray Computed Tomography (CT) og Light Microscopy (LM) korreleret med Scanning Electron Microscopy (SEM)

Article DOI: 10.3791/53870-v • 10:42 min • June 16th, 2016
June 16th, 2016 •
1, 1, 1, 1
1Department Lippstadt, Hamm-Lippstadt University of Applied Sciences

Chapters

Summary
Automatic Translation

Please note that all translations are automatically generated.

Click here for the English version.

En arbejdsgang for omfattende mikro-karakterisering af aktive optiske enheder er skitseret. Den indeholder strukturelle såvel som funktionelle undersøgelser ved hjælp af CT, LM og SEM. Fremgangsmåden er påvist i en hvid LED, som kan stadig betjenes under karakterisering.

Tags

Engineering lysdiode X-Ray computertomografi korreleret lys- og elektronmikroskopi mikroanalyse prøveforberedelse fremstilling af tværsnit
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter