Journal
/
/
Probing C<sub> 84</sub> -embedded Si-Substrat mit Hilfe der Rastersondenmikroskopie und Molecular Dynamics
JoVE Journal
Engineering
A subscription to JoVE is required to view this content.  Sign in or start your free trial.
JoVE Journal Engineering
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Probing C<sub> 84</sub> -embedded Si-Substrat mit Hilfe der Rastersondenmikroskopie und Molecular Dynamics

11,567 Views

13:58 min

September 28, 2016

DOI:

13:58 min
September 28, 2016

12 Views
, , , ,

Summary

Automatically generated

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

Read Article