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使用混合原子力显微镜扫描电化学显微镜(AFM-SECM)探测纳米材料的表面电化学活性
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
DOI:

08:31 min

February 10, 2021

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Chapters

  • 00:04Introduction
  • 01:17Sample Preparation for AFM-SECM
  • 02:01Setup and Operation of AFM-SECM
  • 06:24Results: Topography and Current Imaging of ONBs and Cu2O NPs by AFM-SECM
  • 07:33Conclusion

Summary

Automatic Translation

原子力显微镜 (AFM) 与扫描电化学显微镜 (SECM) 相结合,即 AFM-SECM,可用于同时获取纳米级材料表面的高分辨率地形和电化学信息。这些信息对于了解纳米材料、电极和生物材料的局部表面的异质特性(例如反应、缺陷和反应位点)至关重要。

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