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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Article DOI: 10.3791/61758-v • 06:24 min • September 13th, 2020
September 13th, 2020 •
1, 1, 1, 2, 2, 2, 2, 2
1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

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Summary
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A number of different procedures for preparing nanoparticles for surface analysis are presented (drop casting, spin coating, deposition from powders, and cryofixation). We discuss the challenges, opportunities, and possible applications of each method, particularly regarding the changes in the surface properties caused by the different preparation methods.

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Nanoparticles ToF-SIMS XPS Analysis Sample Preparation Analytical Question Safety Contaminations Suspension Ultra Pure Water Vortexer Drop Dry Method Silicon Wafer UV Ozone Cleaner Microliter Drop O-ring Vacuum Desiccator Light Microscopy Particle Distribution
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