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原子探针层析成像研究在Cu(铟,镓)硒<sub> 2</sub>晶界
JoVE Journal
Engineering
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JoVE Journal Engineering
Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
DOI:

09:51 min

April 22, 2013

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Chapters

  • 00:05Title
  • 02:29Sample Fabrication for Atom Probe Tomography Analysis
  • 05:43Atom Probe Tomography Analysis in a CAMECA LEAP 3000X HR System
  • 06:31Reconstruction of Atom Probe Tomography Data
  • 07:13Results: Elemental Maps and Concentration Depth Profiles of a Grain Boundary
  • 08:38Conclusion

Summary

Automatic Translation

在这项工作中,我们描述了使用的原子探针层析成像技术研究中的CIGS型太阳能电池的吸收层的晶粒边界。这里也提出一种新颖的方法来准备包含所需的晶界结构与已知的原子探针提示。

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