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Atom Probe tomografi Studier på Cu (I, Ga) SE
 
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Atom Probe tomografi Studier på Cu (I, Ga) SE

Article doi: 10.3791/50376
April 22nd, 2013 •
1, 1, 1, 1, 2, 1
1Department of Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, 2Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg ( ZSW )

Summary
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April 22nd, 2013

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I dette arbeidet, beskriver vi bruken av atom-sonde tomografi teknikk for å studere korngrensene fra absorberen lag i en CIGS solcelle. En ny tilnærming for å forberede atomet probespisser inneholder ønsket korn grensen med en kjent struktur blir også presentert her.

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