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電子チャネリング強化マイクロ分析による結晶材料における機能的ドーパント/点欠陥の定量的原子部位解析
JoVE Journal
Chemistry
This content is Free Access.
JoVE Journal
Chemistry
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Please note that all translations are automatically generated.
Click here for the English version.
電子チャネリング強化マイクロ分析による結晶材料における機能的ドーパント/点欠陥の定量的原子部位解析
DOI:
10.3791/62015-v
•
07:24 min
•
May 10, 2021
•
Masahiro Ohtsuka
,
Shunsuke Muto
1
Electron Nanoscopy Division, Advanced Measurement Technology Center, Institute of Materials & Systems for Sustainability
,
Nagoya University
Chapters
00:04
Introduction
00:59
Transmission Electron Microscopy (TEM) Alignment for Beam-Rocking
02:36
Incident Beam Collimation and Pivot Point Setup
03:47
Electron-Channeling Pattern (ECP) Acquisition
04:30
Energy-Dispersive X-Ray Analysis
05:10
Results: Representative ECP and ICP Emission Imaging
06:46
Conclusion
Summary
Automatic Translation
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Automatic Translation
不純物の部位占有量を推定する定量的微分分析法の概要を、少数種、光元素、酸素空孔、その他の点線/平面欠陥から確実に抽出する電子ビーム揺動条件下での電子チャネリング現象を利用して提供します。
Tags
Quantitative Analysis
Atomic-site
Functional Dopants
Point Defects
Crystalline Materials
Electron-channeling-enhanced Microanalysis
Energy-dispersive X-ray Spectroscopy
Electron Energy-loss Spectroscopy
Lattice Defects
Vacancies
Interstitials
Grain Boundaries
Transmission Electron Microscopy
STEM
Optical Axis Alignment
Beam Rocking
Caustic Spot
Condenser Aperture
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