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使用串行块面和聚焦的Ion光束扫描电子显微镜进行有针对性的研究
JoVE Journal
Biology
This content is Free Access.
JoVE Journal
Biology
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Please note that all translations are automatically generated.
Click here for the English version.
使用串行块面和聚焦的Ion光束扫描电子显微镜进行有针对性的研究
DOI:
10.3791/59480-v
•
09:09 min
•
August 10, 2019
•
Christopher J. Guérin
2,3
,
Anna Kremer
2,3
,
Peter Borghgraef
2,3
,
Saskia Lippens
2,3
1
VIB Bio Imaging Core
,
2
VIB Inflammation Research Center
,
3
Department of Molecular Biomedical Research
,
UGent
Chapters
00:04
Title
00:51
Sample Fixation and Processing for Electron Microscopy
03:51
Prepare Embedded Samples for Imaging
05:03
Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing
06:22
Imaging in the FIB-SEM (Focused Ion Beam SEM)
07:49
Results: SBF-SEM and FIB-SEM Data
08:46
Conclusion
Summary
Automatic Translation
English (Original)
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Automatic Translation
在这里,我们提出了一个协议,有效地结合串行块面和聚焦电束扫描电子显微镜的目标领域。这允许在三维中进行高效的搜索,并在大型视野中定位罕见事件。
Tags
Serial Block Face Scanning Electron Microscopy (SBF-SEM)
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
3D Ultrastructure
Arabidopsis Thaliana
Root Tips
Sample Preparation
Fixation
Post-fixation
Osmium Tetroxide
Ruthenium Red
Thiocarbohydrazide (TCH)
Dehydration
Microwave
Phosphate Buffer
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