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Serial Block-Face Scanning Electron Microscopy (SBEM) voor de studie van dendritische stekels
JoVE Journal
Neuroscience
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JoVE Journal Neuroscience
Serial Block-Face Scanning Electron Microscopy (SBEM) for the Study of Dendritic Spines
DOI:

11:16 min

October 02, 2021

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Chapters

  • 00:05Introduction
  • 01:56Sample Contrasting
  • 05:29Dehydration and Resin Embedding
  • 08:02Trimming and Mounting
  • 09:12Serial Block‐Face Scanning Electron Microscopy Imaging
  • 09:47Representative Results: Dendritic Spine Analysis Using Serial Block‐Face Scanning Electron Microscopy
  • 10:35Conclusion

Summary

Automatic Translation

Serial Block-Face Scanning Electron Microscopy (SBEM) wordt toegepast op beeld en analyseren van dendritische stekels in de muriene hippocampus.

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