Journal
/
/
低温电子显微镜样品制备借助于聚焦离子束
JoVE Journal
Biology
This content is Free Access.
JoVE Journal Biology
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
DOI:

10:54 min

July 26, 2014

, , ,

Chapters

  • 00:05Title
  • 01:25Sample Freezing
  • 03:21Ion Milling
  • 05:56Cryo Transfer to TEM
  • 08:54Results: Visualization of Aspergillus niger Spores Using Cryo-microscopy
  • 10:20Conclusion

Summary

Automatic Translation

低温电子显微镜,或扫描(SEM)或透射(TEM),被广泛地用于具有高的水含量1的生物样品或其它材料的特性。的SEM /聚焦离子束(FIB)来识别的样品中感兴趣的特征,并提取用于转移到低温TEM薄,电子透明薄片。

Related Videos

Read Article