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Journal / Biology / Cryo-microscopia elettronica Preparazione del…
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Cryo-microscopia elettronica Preparazione del campione per mezzo di un Focused Ion Beam
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Cryo-microscopia elettronica Preparazione del campione per mezzo di un Focused Ion Beam

Article DOI: 10.3791/51463-v • 10:54 min • July 26th, 2014
July 26th, 2014 •
1,4, 3, 2, 1
1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo

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Cryo Electron Microscopi, sia a scansione (SEM) o trasmissione (TEM), sono ampiamente utilizzati per la caratterizzazione di campioni biologici o di altri materiali con un elevato contenuto di acqua 1. A SEM / Focused Ion Beam (FIB) viene utilizzato per identificare le caratteristiche di interesse in campioni ed estrarre una lamella sottile elettrone-trasparente per il trasferimento ad un crio-TEM.

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Bioingegneria cryoelectron microscopia scienze della vita (Generale) Cryo-microscopio un fascio ionico focalizzato preparazione del campione TEM FIB
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