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Journal / Chemistry / In Situ SIMS y espectroscopia IR de superficies…
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In Situ SIMS y espectroscopia IR de superficies bien definidas Preparado por Soft Landing de iones seleccionados-Mass
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In Situ SIMS y espectroscopia IR de superficies bien definidas Preparado por Soft Landing de iones seleccionados-Mass

Article DOI: 10.3791/51344 • 10:22 min
June 16th, 2014 •
1, 1, 1
1Physical Sciences Division, Pacific Northwest National Laboratory

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June 16th, 2014

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Aterrizaje suave de los iones de masa-seleccionada sobre las superficies es un enfoque poderoso para la preparación altamente controlada de nuevos materiales. Junto con el análisis por espectrometría de masas de iones secundarios situ (SIMS) y espectroscopía de absorción reflexión infrarroja (IRRAS), aterrizaje suave proporciona una visión sin precedentes en las interacciones de las especies bien definidas con las superficies.

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